Title :
Electrochemical measurement System Based on Thick-Film Sensors
Author :
Pavel, Steffan ; Jaormir, H. ; Richard, Ficek ; Vrba, Radimir
Author_Institution :
Fac. of Electr. Eng. & Commun., Brno Univ. of Technol.
fDate :
Oct. 18 2006-Sept. 20 2006
Abstract :
A new electroanalytical measurement system (micropotentiostat) for electrochemical analysis was designed onto a microchip. The microchip was fabricated in CMOS technology AMIS 0.7 and can store correction data in integrated PROM memory. The microchip was implemented on thick-film sensor to provide potentiometric measurements as cyclic voltammetry, amperometry, etc. The measurement can be done at wide dynamic range with 8 orders of a current range
Keywords :
CMOS analogue integrated circuits; PROM; electrochemical sensors; lab-on-a-chip; microsensors; thick film sensors; CMOS technology AMIS; amperometry; cyclic voltammetry; electrochemical analysis; electrochemical measurement system; microchip fabrication; micropotentiostat; potentiometric measurements; thick-film sensors; CMOS technology; Control systems; Current measurement; Electrodes; Integrated circuit measurements; Semiconductor device measurement; Sensor systems; Thick film sensors; Thickness measurement; Voltage;
Conference_Titel :
Communications and Information Technologies, 2006. ISCIT '06. International Symposium on
Conference_Location :
Bangkok
Print_ISBN :
0-7803-9741-X
Electronic_ISBN :
0-7803-9741-X
DOI :
10.1109/ISCIT.2006.340031
