• DocumentCode
    2184049
  • Title

    Trimming lithography part I: The alternative technology for sub-resolution and sub-wavelength patterning

  • Author

    Atthi, Nithi ; Sriklat, Arreerat ; Jeamsaksiri, Wutthinan ; Hruanun, Charndet ; Poyai, Amporn ; Silapunt, Rardchawadee

  • Author_Institution
    Thai Microelectron. Center (TMEC), Nat. Electron. & Comput. Technol. Center (NECTEC), Pathumthani, Thailand
  • fYear
    2011
  • fDate
    17-19 May 2011
  • Firstpage
    42
  • Lastpage
    45
  • Abstract
    Lithography is the key technology to scale down a size of integrated circuits that will increase the performance of an electronics device (smaller, faster, cheaper, and low power consumption). There are many lithographic techniques which can produce a nanometer feature size. However, the cost for equipment and mask for those techniques is extremely high. Based on this limitation, this paper introduces an alternative patterning technique called Trimming lithography to produce sub-resolution and sub-wavelength features. The results show that as small as 0.18 μm photoresist linewidth can be produced using the 0.8 μm pattern on a conventional binary mask. The trimming lithography can thus be one of the candidates for future lithography.
  • Keywords
    integrated circuits; masks; photolithography; photoresists; binary mask; electronic device; integrated circuits; photoresist linewidth; size 0.8 mum; subresolution patterning; subwavelength patterning; trimming lithography technique; Moore´s law; Next generation lithography; Pattern shrinkage; Sub-resolution patterning; Trimming lithography;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Engineering/Electronics, Computer, Telecommunications and Information Technology (ECTI-CON), 2011 8th International Conference on
  • Conference_Location
    Khon Kaen
  • Print_ISBN
    978-1-4577-0425-3
  • Type

    conf

  • DOI
    10.1109/ECTICON.2011.5947766
  • Filename
    5947766