DocumentCode :
2184049
Title :
Trimming lithography part I: The alternative technology for sub-resolution and sub-wavelength patterning
Author :
Atthi, Nithi ; Sriklat, Arreerat ; Jeamsaksiri, Wutthinan ; Hruanun, Charndet ; Poyai, Amporn ; Silapunt, Rardchawadee
Author_Institution :
Thai Microelectron. Center (TMEC), Nat. Electron. & Comput. Technol. Center (NECTEC), Pathumthani, Thailand
fYear :
2011
fDate :
17-19 May 2011
Firstpage :
42
Lastpage :
45
Abstract :
Lithography is the key technology to scale down a size of integrated circuits that will increase the performance of an electronics device (smaller, faster, cheaper, and low power consumption). There are many lithographic techniques which can produce a nanometer feature size. However, the cost for equipment and mask for those techniques is extremely high. Based on this limitation, this paper introduces an alternative patterning technique called Trimming lithography to produce sub-resolution and sub-wavelength features. The results show that as small as 0.18 μm photoresist linewidth can be produced using the 0.8 μm pattern on a conventional binary mask. The trimming lithography can thus be one of the candidates for future lithography.
Keywords :
integrated circuits; masks; photolithography; photoresists; binary mask; electronic device; integrated circuits; photoresist linewidth; size 0.8 mum; subresolution patterning; subwavelength patterning; trimming lithography technique; Moore´s law; Next generation lithography; Pattern shrinkage; Sub-resolution patterning; Trimming lithography;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electrical Engineering/Electronics, Computer, Telecommunications and Information Technology (ECTI-CON), 2011 8th International Conference on
Conference_Location :
Khon Kaen
Print_ISBN :
978-1-4577-0425-3
Type :
conf
DOI :
10.1109/ECTICON.2011.5947766
Filename :
5947766
Link To Document :
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