• DocumentCode
    2184211
  • Title

    Microstructure and mechanical properties of Sn3Ag0.5Cu3Bi0.05Cr/Cu joints

  • Author

    Lin, Fei ; Bi, Wenzhen ; Ju, Guokui ; Xie, Shifang ; Wei, Xicheng

  • Author_Institution
    Sch. of Mater. Sci. & Eng., Shanghai Univ., Shanghai, China
  • fYear
    2011
  • fDate
    8-11 Aug. 2011
  • Firstpage
    1
  • Lastpage
    5
  • Abstract
    The mechanical properties and interfacial microstructure of Cu/Sn3Ag0.5Cu3Bi0.05Cr/Cu (Cu/SACBC/Cu) and Cu/Sn3.0Ag0.5Cu/Cu (Cu/SAC/Cu) joints were comparatively investigated after isothermal aging at 85 °C, 120°C and 150°C for 24, 168, 500 and 1000 h, respectively. The mechanism of Bi addition affecting the intermetallic compounds (IMCs) growth was discussed. Results show that the tensile strength of Cu/SACBC/Cu and Cu/SAC/Cu joints both decreased exponentially with aging time at any temperature and declined linearly with the increased temperature, while the rate of strength decrease for the former joint was lower with an order of magnitude. The SEM observation on the tensile fracture surfaces for Cu/SACBC/Cu joints shows that the tensile fracture mechanism transformed from a quasi-cleavage fracture to a cleavage-like brittle fracture after aging at 150 °C, while quasi-cleavage fracture is the main fracture mode for 120 °C and 85 °C. The relative stable tensile strength for Cu/SACBC/Cu joints can be attributed to thinner interfacial layer and strengthened Sn matrix with the solution strengthening and precipitating effects of Bi. The growth behaviors of interfacial IMCs were similar after aging at 150°C, 120°C and 85°C.
  • Keywords
    ageing; bismuth alloys; chromium alloys; copper alloys; mechanical properties; silver alloys; soldering; tin alloys; Sn3Ag0.5Cu3Bi0.05Cr-Cu; interfacial microstructure; intermetallic compounds; isothermal aging; mechanical properties; temperature 120 degC; temperature 150 degC; temperature 85 degC; tensile strength; Aging; Bismuth; Copper; Joints; Soldering; Temperature; Tin;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Packaging Technology and High Density Packaging (ICEPT-HDP), 2011 12th International Conference on
  • Conference_Location
    Shanghai
  • Print_ISBN
    978-1-4577-1770-3
  • Electronic_ISBN
    978-1-4577-1768-0
  • Type

    conf

  • DOI
    10.1109/ICEPT.2011.6066861
  • Filename
    6066861