DocumentCode
2184344
Title
Study of optimal load lock dedication for cluster tools
Author
Christopher, Julie
Author_Institution
IBM Microelectron., Hopewell Junction, NY, USA
fYear
2008
fDate
7-10 Dec. 2008
Firstpage
2136
Lastpage
2140
Abstract
Cluster or chamber tools are often used in the semiconductor industry. In a research environment, moving to smaller device dimensions requires experimentation with new chamber types and materials to overcome challenges with Moore¿s Law. To make the most of expensive mainframes and clean room floor space multiple chamber types can be placed on one mainframe. Although this type of configuration can reduce cost while evaluating new complex processes, the efficiency of the tool as a whole can be drastically reduced. A major bottleneck within tools configured with multiple process chambers can be the load locks. These load locks are the single wafer entry point into the vacuum chamber. This paper will show the effect of load lock dedication on a sample multi-process chamber tool.
Keywords
semiconductor device manufacture; wafer level packaging; Moore Law; chamber tools; clean room floor space; cluster tools; multiprocess chamber tool; optimal load lock dedication; semiconductor industry; single wafer entry point; vacuum chamber; Cleaning; Costs; Discrete event simulation; Electronics industry; Manufacturing processes; Microelectronics; Moore´s Law; Robots; Semiconductor materials; Throughput;
fLanguage
English
Publisher
ieee
Conference_Titel
Simulation Conference, 2008. WSC 2008. Winter
Conference_Location
Austin, TX
Print_ISBN
978-1-4244-2707-9
Electronic_ISBN
978-1-4244-2708-6
Type
conf
DOI
10.1109/WSC.2008.4736311
Filename
4736311
Link To Document