DocumentCode :
2184453
Title :
Simulation of Mobility Variation and Drift Velocity Enhancement Due to Uniaxial Stress Combined with Biaxial Strain in Si PMOS
Author :
Pham, A.T. ; Jungemann, C. ; Meinerzhagen, B.
Author_Institution :
BST, Tech. Univ. Braunschweig, Braunschweig
fYear :
2009
fDate :
27-29 May 2009
Firstpage :
1
Lastpage :
4
Abstract :
In this work, simulations of mobility variation due to the combination of uniaxial stress and biaxial strain are presented. This study provides a better understanding of the mobility variation and predicts the mobility enhancement for higher stress levels. Transport in the non-equilibrium regime is also investigated. High-field channel drift velocity characteristics are evaluated and compared for different combinations of uniaxial stress and biaxial strain. A better overview of the transport enhancement due to stress/strain at different transport situations including near and non-equilibrium is provided.
Keywords :
Ge-Si alloys; MOSFET; carrier mobility; semiconductor device models; silicon; stress effects; Si-SiGe; biaxial strain; drift velocity enhancement; mobility variation simulation; silicon PMOS transistors; uniaxial stress; Capacitive sensors; Compressive stress; Effective mass; Electron mobility; Phonons; Rough surfaces; Scattering; Surface roughness; Tensile stress; Uniaxial strain;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Computational Electronics, 2009. IWCE '09. 13th International Workshop on
Conference_Location :
Beijing
Print_ISBN :
978-1-4244-3925-6
Electronic_ISBN :
978-1-4244-3927-0
Type :
conf
DOI :
10.1109/IWCE.2009.5091150
Filename :
5091150
Link To Document :
بازگشت