• DocumentCode
    2184453
  • Title

    Simulation of Mobility Variation and Drift Velocity Enhancement Due to Uniaxial Stress Combined with Biaxial Strain in Si PMOS

  • Author

    Pham, A.T. ; Jungemann, C. ; Meinerzhagen, B.

  • Author_Institution
    BST, Tech. Univ. Braunschweig, Braunschweig
  • fYear
    2009
  • fDate
    27-29 May 2009
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    In this work, simulations of mobility variation due to the combination of uniaxial stress and biaxial strain are presented. This study provides a better understanding of the mobility variation and predicts the mobility enhancement for higher stress levels. Transport in the non-equilibrium regime is also investigated. High-field channel drift velocity characteristics are evaluated and compared for different combinations of uniaxial stress and biaxial strain. A better overview of the transport enhancement due to stress/strain at different transport situations including near and non-equilibrium is provided.
  • Keywords
    Ge-Si alloys; MOSFET; carrier mobility; semiconductor device models; silicon; stress effects; Si-SiGe; biaxial strain; drift velocity enhancement; mobility variation simulation; silicon PMOS transistors; uniaxial stress; Capacitive sensors; Compressive stress; Effective mass; Electron mobility; Phonons; Rough surfaces; Scattering; Surface roughness; Tensile stress; Uniaxial strain;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computational Electronics, 2009. IWCE '09. 13th International Workshop on
  • Conference_Location
    Beijing
  • Print_ISBN
    978-1-4244-3925-6
  • Electronic_ISBN
    978-1-4244-3927-0
  • Type

    conf

  • DOI
    10.1109/IWCE.2009.5091150
  • Filename
    5091150