• DocumentCode
    2184502
  • Title

    Surface reconstruction of noisy and defective data sets

  • Author

    Xie, Huan ; McDonnell, T. ; Qin, Hong

  • Author_Institution
    Dept. of Comput. Sci., State Univ. of New York, Stony Brook, NY, USA
  • fYear
    2004
  • fDate
    10-15 Oct. 2004
  • Firstpage
    259
  • Lastpage
    266
  • Abstract
    We present a novel surface reconstruction algorithm that can recover high-quality surfaces from noisy and defective data sets without any normal or orientation information. A set of new techniques is introduced to afford extra noise tolerability, robust orientation alignment, reliable outlier removal, and satisfactory feature recovery. In our algorithm, sample points are first organized by an octree. The points are then clustered into a set of monolithically singly-oriented groups. The inside/outside orientation of each group is determined through a robust voting algorithm. We locally fit an implicit quadric surface in each octree cell. The locally fitted implicit surfaces are then blended to produce a signed distance field using the modified Shepard´s method. We develop sophisticated iterative fitting algorithms to afford improved noise tolerance both in topology recognition and geometry accuracy. Furthermore, this iterative fitting algorithm, coupled with a local model selection scheme, provides a reliable sharp feature recovery mechanism even in the presence of bad input.
  • Keywords
    computer graphics; feature extraction; image reconstruction; iterative methods; octrees; surface fitting; surface reconstruction; computer graphics; defective data sets; feature recovery mechanism; iterative fitting algorithm; modified Shepard method; noise tolerance; robust voting algorithm; surface reconstruction; topology recognition; Clustering algorithms; Computer graphics; Filling; Image reconstruction; Iterative algorithms; Noise robustness; Reconstruction algorithms; Surface fitting; Surface reconstruction; Topology;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Visualization, 2004. IEEE
  • Print_ISBN
    0-7803-8788-0
  • Type

    conf

  • DOI
    10.1109/VISUAL.2004.101
  • Filename
    1372205