• DocumentCode
    2184511
  • Title

    Analysis of multiple process flows in an ASIC fab with a detailed photolithography area model

  • Author

    Kabak, Kamil Erkan ; Heavey, Cathal ; Corbett, Vincent

  • Author_Institution
    Enterprise Res. Centre, Univ. of Limerick, Limerick, Ireland
  • fYear
    2008
  • fDate
    7-10 Dec. 2008
  • Firstpage
    2185
  • Lastpage
    2193
  • Abstract
    ASIC fabs are characterized by multiple process flows. This is mainly due to the highly diversified product portfolios within such fabs. In this study, we first examined the cycle time for individual process flows in a medium volume ASIC fab. We compared these process flows in terms of overall cycle time and using a cycle time index. Secondly, focusing on photolithography we developed a simulation model that employs cycle time data to analyze the impacts of process flow diversity. Thirdly, we used this model to examine the impact on cycle time of changing the volumes of wafer starts on different process flows. The detailed results of simulation experiments along with the concluding remarks are given at the end of the study.
  • Keywords
    application specific integrated circuits; photolithography; ASIC fab; cycle time index; highly diversified product portfolios; multiple process flows; photolithography area model; process flow diversity; Analytical models; Application specific integrated circuits; Costs; Data analysis; Delay effects; Fabrication; Lithography; Predictive models; Resists; Semiconductor device modeling;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Simulation Conference, 2008. WSC 2008. Winter
  • Conference_Location
    Austin, TX
  • Print_ISBN
    978-1-4244-2707-9
  • Electronic_ISBN
    978-1-4244-2708-6
  • Type

    conf

  • DOI
    10.1109/WSC.2008.4736318
  • Filename
    4736318