• DocumentCode
    2184535
  • Title

    An optimization framework for waferfab performance enhancement

  • Author

    Noack, Daniel ; Gan, Boon Ping ; Lendermann, Peter ; Rose, Oliver

  • Author_Institution
    D-SIMLAB Technol., Singapore, Singapore
  • fYear
    2008
  • fDate
    7-10 Dec. 2008
  • Firstpage
    2194
  • Lastpage
    2200
  • Abstract
    A typical wafer fab requires numerous decisions for daily operations. Even small decisions on system configurations may have significant impact on the overall fab performance. One of the most critical performance measure is cycle time, where just one day of reduction could represent significant cost savings. In this paper we describe an automated simulation-based optimization method to improve fab configurations. We illustrated our method through a case study that involves optimization of multiple decision variables in a wafer fab. The objective of the optimization is to reduce the cycle time. We show the potentials of such an optimization through achieving an improvement of 15% in cycle time for a furnace toolset.
  • Keywords
    costing; discrete event simulation; integrated circuit manufacture; optimisation; automated simulation-based optimization method; cost savings; cycle time; waferfab performance enhancement; Cities and towns; Computational modeling; Computer science; Costs; Furnaces; Gallium nitride; Humans; Optimization methods; Production facilities; Time measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Simulation Conference, 2008. WSC 2008. Winter
  • Conference_Location
    Austin, TX
  • Print_ISBN
    978-1-4244-2707-9
  • Electronic_ISBN
    978-1-4244-2708-6
  • Type

    conf

  • DOI
    10.1109/WSC.2008.4736319
  • Filename
    4736319