• DocumentCode
    2184651
  • Title

    Signal integrity simulation for SiP using GTLE

  • Author

    Jia, Jia ; Cao, Liqiang ; Wan, Lixi

  • Author_Institution
    Inst. of Microelectron., Beijing, China
  • fYear
    2011
  • fDate
    8-11 Aug. 2011
  • Firstpage
    1
  • Lastpage
    3
  • Abstract
    Signal integrity (SI) simulation for system-in-package (SiP) is a bottleneck in SiP design flow. This paper presents a novel numerical algorithm for SI simulation in packaging structure. This algorithm is based on 2D Generalized Transmission Line Equation (GTLE), Finite Difference Time Domain (FDTD) and mesh division technique. SI is simulated using mesh division technique where the model of SI is obtained by regarding each cell as a 2D transmission line. 2D GTLE is a group partial equation about voltage and current density distribution on a power/ground plane pair. After reduction, the voltage equation for 2D GTLE is obtained, which is a wave equation. One method to solve the wave equation is by the finite-difference scheme. In this paper, the fringe effect and absorbing boundary condition is applied to implement the wave equation efficiently and easily. Three test cases are presented to explain the solution of the wave equation. The methodology described in prior section has been implemented in a CAD tools. The results from our method were compared to those from the full-wave simulator to show efficiently in signal integrity simulation.
  • Keywords
    finite difference time-domain analysis; system-in-package; 2D GTLE; 2D generalized transmission line equation; 2D transmission line; CAD tools; FDTD; SI simulation; SiP design flow; finite difference time domain; full-wave simulator; mesh division technique; power-ground plane pair; signal integrity simulation; system-in-package; wave equation; Equations; Finite difference methods; Integrated circuit modeling; Mathematical model; Numerical models; Solid modeling; Time domain analysis;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Packaging Technology and High Density Packaging (ICEPT-HDP), 2011 12th International Conference on
  • Conference_Location
    Shanghai
  • Print_ISBN
    978-1-4577-1770-3
  • Electronic_ISBN
    978-1-4577-1768-0
  • Type

    conf

  • DOI
    10.1109/ICEPT.2011.6066878
  • Filename
    6066878