DocumentCode :
2184916
Title :
Influence of interfacial delamination on temperature distribution of QFN packages
Author :
Zhaowei, Ban ; Fei, Qin ; Tong, An ; Guofeng, Xia ; Chengyan, Liu
Author_Institution :
Coll. of Mech. Eng. & Appl. Electron. Technol., Beijing Univ. of Technol., Beijing, China
fYear :
2011
fDate :
8-11 Aug. 2011
Firstpage :
1
Lastpage :
4
Abstract :
Infrared thermography has become increasingly important for non-destructive testing to detect internal defections, involving delaminations, cracks and voids. In this paper, the principle of infrared thermography is presented briefly. And a finite element approach is proposed to simulate the process of infrared thermography nondestructive testing about QFN packages. By changing with the length and the thickness of the delamination and the size of uniform surface heat flux, the surface thermal characteristics of a QFN are analyzed. The simulation results can provide basis and reference for the following work to detect defects in packages by infrared thermography method.
Keywords :
crack detection; delamination; electronics packaging; finite element analysis; infrared imaging; nondestructive testing; temperature distribution; voids (solid); QFN packages; finite element approach; infrared thermography method; interfacial delamination; internal defect detection; nondestructive testing; surface heat flux; surface thermal characteristics; temperature distribution; Delamination; Electronic packaging thermal management; Finite element methods; Heating; Materials; Surface treatment; Temperature; QFN Packages; delamination; finite element method; infrared thermography;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Packaging Technology and High Density Packaging (ICEPT-HDP), 2011 12th International Conference on
Conference_Location :
Shanghai
Print_ISBN :
978-1-4577-1770-3
Electronic_ISBN :
978-1-4577-1768-0
Type :
conf
DOI :
10.1109/ICEPT.2011.6066889
Filename :
6066889
Link To Document :
بازگشت