Title :
Probabilistic Study of the Coupling between Deterministic Electromagnetic Fields and a Stochastic Thin-Wire over a PEC Plane
Author :
Sy, O.O. ; Vaessen, J. A H M ; van Beurden, M.C. ; Tijhuis, A.G. ; Michielsen, B.L.
Author_Institution :
Eindhoven Univ. of Technol., Eindhoven
Abstract :
A stochastic approach is presented to statistically characterize uncertainties in electromagnetic interactions. A stochastically undulating thin wire over a perfectly conducting ground plane is studied. The aim of this paper is to present methods to compute the statistical moments of the voltage induced by a deterministic incident field. Three methods have been developed to compute these moments: a quadrature method, a perturbation approach and a Monte-Carlo method.
Keywords :
Monte Carlo methods; electromagnetic field theory; integration; perturbation techniques; Monte-Carlo method; PEC plane; deterministic electromagnetic fields; electromagnetic interactions; perfectly conducting ground plane; perturbation approach; quadrature method; statistical moments; stochastically undulating thin wire; Electromagnetic compatibility; Electromagnetic coupling; Electromagnetic fields; Electromagnetic scattering; Geometry; Integral equations; Perturbation methods; Stochastic processes; Voltage; Wire;
Conference_Titel :
Electromagnetics in Advanced Applications, 2007. ICEAA 2007. International Conference on
Conference_Location :
Torino
Print_ISBN :
978-1-4244-0767-5
Electronic_ISBN :
978-1-4244-0767-5
DOI :
10.1109/ICEAA.2007.4387382
