DocumentCode
2185315
Title
An SVM based scoring evaluation system for fluorescence microscopic image classification
Author
Lin, Dongyun ; Lin, Zhiping ; Sothiharan, Shakeela ; Lei, Lei ; Zhang, Jingbo
Author_Institution
School of Electrical & Electronic Engineering, Nanyang Technological University, Singapore
fYear
2015
fDate
21-24 July 2015
Firstpage
543
Lastpage
547
Abstract
This paper proposes a scoring evaluation system to the fluorescence microscopic image classification based on the support vector machine (SVM). We define the similarity scores for each testing sample based on its relative distance to the SVM separating hyperplanes and the training clustering centers in the feature space. The method proposed calculates similarity scores through a two-stage process that converts the SVM´s classification results to a quantitative description. The scores can precisely reflect how similar a testing sample to all the categories and provide a reference to further investigation of fluorescence microscopic images.
Keywords
Computer vision; Correlation; Microscopy; Pattern recognition; Support vector machines; Testing; Training; nearest neighbor; scale-invariant feature transform (SIFT); similarity score; support vector machine (SVM);
fLanguage
English
Publisher
ieee
Conference_Titel
Digital Signal Processing (DSP), 2015 IEEE International Conference on
Conference_Location
Singapore, Singapore
Type
conf
DOI
10.1109/ICDSP.2015.7251932
Filename
7251932
Link To Document