• DocumentCode
    2185315
  • Title

    An SVM based scoring evaluation system for fluorescence microscopic image classification

  • Author

    Lin, Dongyun ; Lin, Zhiping ; Sothiharan, Shakeela ; Lei, Lei ; Zhang, Jingbo

  • Author_Institution
    School of Electrical & Electronic Engineering, Nanyang Technological University, Singapore
  • fYear
    2015
  • fDate
    21-24 July 2015
  • Firstpage
    543
  • Lastpage
    547
  • Abstract
    This paper proposes a scoring evaluation system to the fluorescence microscopic image classification based on the support vector machine (SVM). We define the similarity scores for each testing sample based on its relative distance to the SVM separating hyperplanes and the training clustering centers in the feature space. The method proposed calculates similarity scores through a two-stage process that converts the SVM´s classification results to a quantitative description. The scores can precisely reflect how similar a testing sample to all the categories and provide a reference to further investigation of fluorescence microscopic images.
  • Keywords
    Computer vision; Correlation; Microscopy; Pattern recognition; Support vector machines; Testing; Training; nearest neighbor; scale-invariant feature transform (SIFT); similarity score; support vector machine (SVM);
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Digital Signal Processing (DSP), 2015 IEEE International Conference on
  • Conference_Location
    Singapore, Singapore
  • Type

    conf

  • DOI
    10.1109/ICDSP.2015.7251932
  • Filename
    7251932