• DocumentCode
    2185559
  • Title

    Analysis of the field within bounded wave simulator with a large test object in the working volume

  • Author

    Cheng, Gao ; Bin, Chen ; Bihua, Zhou ; Lihua, Shi ; Tingyong, Wang

  • Author_Institution
    Nanjing Eng. Inst., China
  • fYear
    2000
  • fDate
    2000
  • Firstpage
    433
  • Lastpage
    437
  • Abstract
    A bounded wave simulator is an efficient broad bandwidth illuminator and has been widely used in simulating the EMP pulse propagating in free space with a plane wave model. A test object in the working volume will cause field distortion. In this paper, the FDTD method is used to calculate the field distributions when a test object is situated in the bounded wave simulator or in a radiated plane wave. The errors of the field distribution according to the different ratio of the test object dimensions to the height of the working space is calculated and compared with the field in free space, especially the tangential H field component on the conductor surface. The method to determine the maximum test size in an EMP simulator is corrected based on our discussion. The advantage of the new method is that the results are more reasonable than before
  • Keywords
    electromagnetic fields; electromagnetic pulse; electromagnetic wave transmission; finite difference time-domain analysis; transmission line theory; EMP pulse; FDTD method; bounded wave simulator; broad bandwidth illuminator; field distortion; field distribution; free space; large test object; maximum test size; plane wave model; radiated plane wave; working volume; Analytical models; Bandwidth; Conductors; EMP radiation effects; Electromagnetic transients; Finite difference methods; Maxwell equations; Testing; Time domain analysis; Transmission lines;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Environmental Electromagnetics, 2000. CEEM 2000. Proceedings. Asia-Pacific Conference on
  • Conference_Location
    Shanghai
  • Print_ISBN
    7-5635-0420-6
  • Type

    conf

  • DOI
    10.1109/CEEM.2000.853981
  • Filename
    853981