Title :
NIST comparison of resistances based on the calculable capacitor and the quantum Hall effect
Author :
Shields, J.Q. ; Dziuba, R.F. ; Elmquist, R.E. ; Lee, L.H.
Author_Institution :
Nat. Inst. of Stand. & Technol., Gaithersburg, MD, USA
fDate :
June 27 1994-July 1 1994
Abstract :
The latest NIST results comparing the quantized Hall resistance based on the value R/sub K-90/=25812.807 /spl Omega/ with the realization of the ohm in SI units obtained by direct calculable-capacitor measurements are reported.<>
Keywords :
capacitors; electric resistance measurement; measurement standards; quantum Hall effect; units (measurement); 25812.807 ohm; NIST comparison; SI units; capacitor; ohm; quantized Hall resistance; quantum Hall effect; resistances; Bridges; Capacitors; Electrical resistance measurement; Hall effect; Laboratories; NIST; Q measurement; Resistors; Superconducting magnets; Uncertainty;
Conference_Titel :
Precision Electromagnetic Measurements, 1994. Digest., 1994 Conference on
Conference_Location :
Boulder, CO, USA
Print_ISBN :
0-7803-1984-2
DOI :
10.1109/CPEM.1994.333341
