Title :
Parity-controlled charge modulation of the supercurrent in the single electron transistor
Author :
Joyez, P. ; Vion, D. ; Bouchiat, V. ; Esteve, D. ; Devoret, M.H.
Author_Institution :
Service de Phys. de l´Etat Condense, Gif-sur-Yvette, France
fDate :
June 27 1994-July 1 1994
Abstract :
We have measured the parity-controlled charge modulation of the supercurrent in a superconducting single electron transistor, at different magnetic field and temperatures. We observed the characteristic features of the poisoning of the supercurrent enhancement.<>
Keywords :
charge measurement; electron device testing; modulation; superconducting junction devices; transistors; canonical conjugation; gate charge; magnetic field; parity-controlled charge modulation; poisoning; single electron transistor; superconducting single electron transistor; supercurrent; supercurrent enhancement; temperature; Charge measurement; Circuits; Current measurement; Fluctuations; Josephson junctions; Lead; Magnetic field measurement; Single electron transistors; Superconducting filters; Temperature;
Conference_Titel :
Precision Electromagnetic Measurements, 1994. Digest., 1994 Conference on
Conference_Location :
Boulder, CO, USA
Print_ISBN :
0-7803-1984-2
DOI :
10.1109/CPEM.1994.333354
