DocumentCode
2185878
Title
Scaling limits of rectangular and trapezoidal channel FinFETs
Author
Mohseni, J. ; Meindl, J.D.
Author_Institution
Georgia Inst. Of Technol., Atlanta, GA, USA
fYear
2013
fDate
20-23 Feb. 2013
Firstpage
1
Lastpage
3
Abstract
Here we present a complete analytical model that characterizes all the variations of multi-gate MOSFETs including the Tri-gate FinFET (Figure 1), all-around gate FinFET, Trapezoidal FinFET, Double-gate MOSFET, etc. Next we present a complete comparison between ideal rectangular FinFETs and trapezoidal FinFETs. Finally, for the first time, we present the ultimate limit for scaling of rectangular and trapezoidal FinFETs.
Keywords
MOSFET; multigate MOSFET; rectangular channel FinFET; saling limit; tigate FinFET; trapezoidal channel FinFET; Capacitors; Etching; Frequency modulation; Logic gates; Performance evaluation; Semiconductor device modeling;
fLanguage
English
Publisher
ieee
Conference_Titel
Bioengineering (ENBENG), 2013 IEEE 3rd Portuguese Meeting in
Conference_Location
Braga
Print_ISBN
978-1-4673-4859-1
Type
conf
DOI
10.1109/ENBENG.2013.6518425
Filename
6518425
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