Title :
Non-destructive permittivity measurement of substrates
Author_Institution :
GDK Products, Cazenovia, NY, USA
fDate :
June 27 1994-July 1 1994
Abstract :
The permittivity of a thin flat dielectric is calculated from the characteristics of the H-011 resonance in a cylindrical cavity with the specimen inserted an the central transverse plane. Dielectric constants from 1 to 300 and loss tangents as low as 30/spl plusmn/10 ppm have been determined. No irreversible specimen preparation is required.<>
Keywords :
cavity resonators; dielectric loss measurement; nondestructive testing; permittivity measurement; substrates; H-011 resonance; anisotropic specimens; calibration; central transverse plane; cylindrical cavity; dielectric constant error; dielectric constants; irreversible specimen preparation; nondestructive permittivity measurement; substrates; thin flat dielectric; Dielectric constant; Dielectric loss measurement; Dielectric losses; Dielectric measurements; Dielectric substrates; Fixtures; Frequency; Insertion loss; Permittivity measurement; Resonance;
Conference_Titel :
Precision Electromagnetic Measurements, 1994. Digest., 1994 Conference on
Conference_Location :
Boulder, CO, USA
Print_ISBN :
0-7803-1984-2
DOI :
10.1109/CPEM.1994.333363
