Title :
Design verification of complex microprocessors
Author :
Yim, Joonseo ; Park, Changjae ; Yang, Wooseung ; Oh, Hunseung ; Choi, Hoon ; Lee, Seungjong ; Won, Nara ; Park, In-Cheol ; Kyung, Chong-Min
Author_Institution :
Dept. of Electr. Eng., Korea Adv. Inst. of Sci. & Technol., Seoul, South Korea
Abstract :
As the complexity of microprocessor increases, functional verification becomes more difficult and emerges as the bottleneck of the design cycle. In this paper, we suggest a functional verification methodology, especially for the compatible microprocessor design. To guarantee the perfect compatibility with previous microprocessors, we developed these C models in different representation levels, i.e Polaris MCV (Micro-Code Verifier) and StreC. An instruction behavioral level C model (Polaris) is verified using the slowed-down PC. In the implementation of micro-architecture, a micro-operational level model (MCV) and RTL model (StreC), both written in C, are co-simulated with consistency checking (IPC) between these two models. The simulation speed of C models makes it possible to test the “real-world” application programs on the C model with a software board model (VPC). To increase the confidence level of verifications, Pro-filer reports the verification coverage of the test program, which is fed back to the automatic test program generator (Pandora). Restartability feature also helps significantly reduce the total simulation time. Using the proposed verification methodology, we designed and verified the K 486, an Intel 486-compatible microprocessor successfully
Keywords :
C language; circuit analysis computing; digital simulation; formal verification; integrated circuit design; microprocessor chips; Polaris MCV; RTL model; StreC; automatic test program generator; compatible microprocessor design; complex microprocessors; consistency checking; design cycle; functional verification methodology; instruction behavioral level C model; micro-architecture; representation levels; simulation speed; software board model; total simulation time; verification coverage; Application software; Automatic testing; Computer bugs; Design methodology; Discrete event simulation; Hardware design languages; Microprocessors; Polarization; Software testing; Transistors;
Conference_Titel :
Circuits and Systems, 1996., IEEE Asia Pacific Conference on
Conference_Location :
Seoul
Print_ISBN :
0-7803-3702-6
DOI :
10.1109/APCAS.1996.569310