A Sinewave Analyzer for Mixed-Signal BIST Applications in a 0.35 um Technology

Author

Barragan, M.J. ; Vazquez, D. ; Rueda, A.

Author_Institution

Inst. de Microelectron. de Sevilla-Centro Nacional de Microelectron., Univ. de Sevilla

fYear

2006

fDate

18-21 April 2006

Firstpage

117

Lastpage

122

Abstract

This paper presents an integrated prototype of a mixed-signal sinewave analyzer. It extracts, in the digital domain, the DC level and the amplitude of the harmonics of a distorted analog sinewave signal. It is based on a double modulation, squarewave and sigma-delta, together with a simple digital processing algorithm. The presented prototype has been integrated in a 0.35 mum technology. It is intended for the characterization of sinewave signals in the range of audio. Experimental measurements in the lab verify the feasibility of the approach and the functionality of the prototype

Keywords

analogue-digital conversion; built-in self test; spectral analysers; 0.35 micron; analog sinewave signal; analog testing; digital processing algorithm; mixed signal sinewave analyzer; mixed-signal BIST; mixed-signal testing; signal analyzers; Built-in self-test; CMOS technology; Circuit testing; Delta-sigma modulation; Performance evaluation; Prototypes; Robustness; Signal analysis; Signal generators; System testing;

fLanguage

English

Publisher

ieee

Conference_Titel

Design and Diagnostics of Electronic Circuits and systems, 2006 IEEE

Conference_Location

Prague

Print_ISBN

1-4244-0185-2

Type

conf

DOI

10.1109/DDECS.2006.1649590

Filename

1649590