Title :
Large signal load-pull measurements using six-port reflectometers
Author :
Deshours, F. ; Bergeault, E. ; Jallet, L. ; Huyart, B.
Author_Institution :
Telecom Paris, France
fDate :
June 27 1994-July 1 1994
Abstract :
This paper describes an active load-pull measurement system, using two six-port junctions for nonlinear characterization of power transistors. Load-pull measurements on a 600 /spl mu/m MESFET have been performed at 2 GHz.<>
Keywords :
computerised instrumentation; microwave reflectometry; power transistors; semiconductor device testing; solid-state microwave devices; 2 GHz; 600 mum; MESFET; active load-pull measurement; calibration; large signal characterisation; nonlinear characterization; power transistors; six-port junctions; six-port reflectometers; Attenuators; Broadband amplifiers; Couplers; High power amplifiers; Impedance; Isolators; Performance evaluation; Phase measurement; Power harmonic filters; Power measurement;
Conference_Titel :
Precision Electromagnetic Measurements, 1994. Digest., 1994 Conference on
Conference_Location :
Boulder, CO, USA
Print_ISBN :
0-7803-1984-2
DOI :
10.1109/CPEM.1994.333395
