DocumentCode :
2187080
Title :
The study on information extraction of BGA solders joint 2-D morphology based on wavelet modulus maximum
Author :
Yuan, Wan ; De-jian, Zhou
Author_Institution :
Sch. of Mech. & Electr. Eng., Guilin Univ. of Electron. Technol., Guilin, China
fYear :
2011
fDate :
8-11 Aug. 2011
Firstpage :
1
Lastpage :
3
Abstract :
The shape information data of the solder joints is one of the foundations for realizing the intelligent identification of solder joint defects in the Surface Mounting Technology (SMT). In this paper, the images of BGA solder joints which collected by the automatic X-ray inspection (AXI) equipment are selected as the research object, and then two-dimensional shape information extraction technology of solder joints has been mainly studied. The basic method is as follows: the images of BGA solder joints firstly are carried out the de-noising and edge extraction processing in the transform domain after wavelet transform, then the corresponding binary images can be gained after morphological processing, lastly the useful two-dimensional shape information (perimeter, area, degree of circularity and voiding area of BGA solder joints) can be obtained by calculating with MATLB software. The study result shows that this algorithm can splendidly split the edge of BGA solder joints and their voiding to get the two-dimensional shape information data, which provides required data for achieving the intelligent identification of solder joint defects.
Keywords :
X-ray apparatus; ball grid arrays; edge detection; electronic engineering computing; feature extraction; image denoising; inspection; solders; surface mount technology; wavelet transforms; AXI equipment; BGA solder joint 2D morphology; MATLB software; SMT; automatic X-ray inspection equipment; binary images; edge extraction processing; image denoising; intelligent identification; surface mounting technology; two-dimensional shape information data; two-dimensional shape information extraction technology; wavelet modulus maximum; wavelet transform; Data mining; Image edge detection; Noise; Noise reduction; Soldering; Wavelet transforms;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Packaging Technology and High Density Packaging (ICEPT-HDP), 2011 12th International Conference on
Conference_Location :
Shanghai
Print_ISBN :
978-1-4577-1770-3
Electronic_ISBN :
978-1-4577-1768-0
Type :
conf
DOI :
10.1109/ICEPT.2011.6066969
Filename :
6066969
Link To Document :
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