Title :
Correlation analysis of speckle pattern of inhomogeneous microrelief
Author :
Maslakov, M.Yu. ; Kochetov, A.Y. ; Zheleznyak, A.P.
Author_Institution :
Inst. of the Modern Technol., Kharkiv, Ukraine
Abstract :
We have derived that the resulting speckle pattern has the highest possible contrast. The produced analytical estimation of the speckle pattern distribution description is reached at the assumption of the rectangular distributions of the used parameters. The purpose of the given work is to develop a technique of the detection of heterogeneity in a structure of the surface microrelief, using an analysis of a speckle pattern formed by this surface
Keywords :
CCD image sensors; light interferometry; optical correlation; speckle; statistical analysis; surface topography measurement; analytical estimation; contrast; correlation analysis; heterogeneity; inhomogeneous microrelief; rectangular distributions; speckle pattern; speckle pattern distribution description; surface microrelief; Laser modes; Lenses; Observatories; Optical surface waves; Pattern analysis; Rough surfaces; Space technology; Speckle; Surface roughness; Surface waves;
Conference_Titel :
Laser and Fiber-Optical Networks Modeling, 2000. Proceedings of LFNM 2000. 2nd International Workshop on
Conference_Location :
Kharkiv
Print_ISBN :
0-7803-6380-9
DOI :
10.1109/LFNM.2000.854056
