Title :
A potential new frequency/wavelength standard at 778 nm: Doppler free two-photon transitions in rubidium
Author :
Millerioux, Y. ; Felder, R. ; Touahri, D. ; Acef, O. ; Hilico, L. ; Clairon, A. ; Biraben, F. ; de Beauvoir, B. ; Julien, L. ; Nez, F.
Author_Institution :
CNAM, Inst. National de Metrol., Paris, France
fDate :
June 27 1994-July 1 1994
Abstract :
We have stabilized two laser diodes on the hyperfine components of the 5D/sub 3/2/ and 5D/sub 5/2/ two-photon transitions in natural rubidium (v=385 THz). We have carefully investigated the metrological features of these devices. So far we obtain a frequency stability in terms of the Allan variance of 3.10/sup -13/./spl tau//sup - 1/2 / up to 2000 s and a frequency repeatability of the order of 10/sup -12/. The frequency difference between the two devices is 1.7 kHz under identical operating conditions.<>
Keywords :
atomic hyperfine structure; frequency measurement; laser frequency stability; measurement standards; rubidium; semiconductor lasers; two-photon processes; 385 THz; 778 nm; Allan variance; Doppler free two-photon transitions; Rb; frequency repeatability; frequency stability; frequency/wavelength standard; hyperfine components; laser diodes; Diode lasers; Frequency measurement; Gratings; Laser transitions; Magnetic fields; Metrology; Photomultipliers; Spectroscopy; Stability; Temperature control;
Conference_Titel :
Precision Electromagnetic Measurements, 1994. Digest., 1994 Conference on
Conference_Location :
Boulder, CO, USA
Print_ISBN :
0-7803-1984-2
DOI :
10.1109/CPEM.1994.333398
