A Unique March Test Algorithm for the Wide Spread of Realistic Memory Faults in SRAMs

Author

Benso, A. ; Bosio, A. ; Di Carlo, S. ; Di Natale, G. ; Prinetto, P.

Author_Institution

Dipt. di Automatica e Informatica, Politecnico di Torino

fYear

2006

fDate

18-21 April 2006

Firstpage

155

Lastpage

156

Abstract

Among the different types of algorithms proposed to test static random access memories (SRAMs), march tests have proven to be faster, simpler and regularly structured. A large number of march tests with different fault coverage have been published. Usually different march tests detect only a specific set of memory faults. The always growing memory production technology introduces new classes of fault, making a key hurdle the generation of new march tests. The aim of this paper is to target the whole set of realistic fault model and to provide a unique march test able to reduce the test complexity of 15.4% than state-of-the-art march algorithm

Keywords

SRAM chips; fault simulation; integrated circuit testing; SRAM; march test algorithm; memory production technology; realistic memory faults; static random access memories; Automatic testing; Circuit faults; Digital systems; Fault detection; Production; Random access memory; SRAM chips; Semiconductor memory; System-on-a-chip; Taxonomy;

fLanguage

English

Publisher

ieee

Conference_Titel

Design and Diagnostics of Electronic Circuits and systems, 2006 IEEE

Conference_Location

Prague

Print_ISBN

1-4244-0185-2

Type

conf

DOI

10.1109/DDECS.2006.1649602

Filename

1649602