DocumentCode :
2187264
Title :
Can clock faults be detected through functional test?
Author :
Metra, C. ; Rossi, Davide ; Omana, M. ; Cazeaux, J.M. ; Mak, T.M.
Author_Institution :
DEIS, Bologna Univ.
fYear :
2006
fDate :
18-21 April 2006
Firstpage :
166
Lastpage :
171
Abstract :
We analyze the probability to detect clock faults indirectly through conventional functional testing by considering realistic datapaths derived from ISCAS´85 benchmarks. We show that, even optimistically assuming that we are able to test all short and long paths for min and max delay violations, the detection of clock faults can not be guaranteed, thus mandating new, specific testing approaches for clock faults, otherwise possibly compromising the system correct operation in the field, with dramatic consequences on product quality and defect level
Keywords :
clocks; fault diagnosis; integrated circuit testing; clock fault detection; functional testing; max delay violations; min delay violations; Benchmark testing; Calibration; Circuit faults; Clocks; Delay effects; Fault detection; Routing; System testing; Timing; Vehicle crash testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Design and Diagnostics of Electronic Circuits and systems, 2006 IEEE
Conference_Location :
Prague
Print_ISBN :
1-4244-0185-2
Type :
conf
DOI :
10.1109/DDECS.2006.1649606
Filename :
1649606
Link To Document :
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