Title :
An Extension of Transient Fault Emulation Techniques to Circuits with Embedded Memories
Author :
Garcia-Valderas, M. ; Portela-Garcia, M. ; Lopez-Ongil, C. ; Entrena, L.
Author_Institution :
Dept. of Electron. Technol., Carlos III Madrid Univ.
Abstract :
Fault injection is commonly used for evaluation of fault tolerance of safety-critical systems. Among the possible fault injection techniques, FPGA-based emulation is very attractive because of its superior performance. In particular, autonomous emulation technique can provide emulation speeds in the order of millions of faults per second. In this paper FPGA-based emulation is extended to circuits with embedded memories. To this purpose, an instrumented memory model is proposed that can be progressively enhanced to increase accuracy at the cost of a larger overhead. Also, an efficient fault injection mechanism is described. This model can be integrated in a seamless manner in an autonomous emulation system, as it is demonstrated using the LEON2 processor benchmark
Keywords :
digital storage; embedded systems; fault simulation; field programmable gate arrays; FPGA-based emulation; LEON2 processor benchmark; autonomous emulation system; embedded memories; fault injection techniques; fault tolerance; instrumented memory model; safety-critical systems; transient fault emulation; Circuit faults; Costs; Ear; Electrical fault detection; Emulation; Fault detection; Instruments; Logic; Registers; Writing;
Conference_Titel :
Design and Diagnostics of Electronic Circuits and systems, 2006 IEEE
Conference_Location :
Prague
Print_ISBN :
1-4244-0185-2
DOI :
10.1109/DDECS.2006.1649615