Title :
A Leakage-Based Random Bit Generator with On-line Fault Detection
Author :
Bucci, M. ; Luzzi, R.
Author_Institution :
Infineon Technol. AG, Munich
Abstract :
This paper presents a new, patent pending, random bit generator whose noise source exploits the leakage current in a reverse biased p-n junction. The circuit is described and a model is provided to estimate data-rate and expected quality of the generated bit sequence. Since the noise source is quasi-stateless, its deterministic evolution does not present complex patterns and therefore a lack of entropy and faults can be detected on-line
Keywords :
fault simulation; integrated circuit design; leakage currents; p-n junctions; random number generation; bit sequence generation; leakage current; leakage-based random bit generator; online fault detection; quasistateless noise source; reverse biased p-n junction; Circuit noise; Cryptography; Electrical fault detection; Entropy; Fault detection; Inverters; Jitter; Leakage current; Noise generators; P-n junctions;
Conference_Titel :
Design and Diagnostics of Electronic Circuits and systems, 2006 IEEE
Conference_Location :
Prague
Print_ISBN :
1-4244-0185-2
DOI :
10.1109/DDECS.2006.1649623
