A de-embedding technique for reflection-based S-parameters measurements of microwave devices

Author

Ghannouchi, Fadhel M. ; Brodeur, A. ; Beauregard, F.

Author_Institution

Dept. of Electr. & Comput. Eng., Ecole Polytech. de Montreal, Que., Canada

fYear

1994

fDate

June 27 1994-July 1 1994

Firstpage

119

Lastpage

120

Abstract

A generalized calibration and de-embedding technique for reflection-based S-parameter measurements of microwave devices is proposed. This technique allows to perform the two-port calibration of a network analyzer directly from the embedded reflection coefficient measurements. This technique is a general one, in the sense that it can be implemented in network analyzers with or without transmission measurement capabilities.<>

Keywords

S-parameters; calibration; microwave devices; microwave measurement; microwave reflectometry; network analysers; waveguides; calibration; circular waveguides; coplanar waveguide lines; de-embedding; embedded reflection coefficient measurements; finlines; microstrip lines; microwave devices; network analyzer; noncoaxial devices; rectangular waveguides; reflection-based S-parameters measurements; two-port calibration; Calibration; Coaxial components; Equations; Fixtures; Microwave devices; Microwave measurements; Microwave theory and techniques; Reflection; Scattering parameters; Testing;

fLanguage

English

Publisher

ieee

Conference_Titel

Precision Electromagnetic Measurements, 1994. Digest., 1994 Conference on

Conference_Location

Boulder, CO, USA

Print_ISBN

0-7803-1984-2

Type

conf

DOI

10.1109/CPEM.1994.333424

Filename

333424