DocumentCode
2188065
Title
Sample preparation device for molding compound adhesion test
Author
Lu, Qin ; Zhang, Wenjing ; Li, Ming ; Mao, Dali
Author_Institution
Sch. of Mater. Sci. & Eng., Shanghai Jiao Tong Univ., Shanghai, China
fYear
2011
fDate
8-11 Aug. 2011
Firstpage
1
Lastpage
3
Abstract
Moisture ingression in plastic packages generally occurs through delaminated interfaces between different materials. So the adhesion strength between molding compound and substrate is crucial to the plastic package reliability. In the present work, a sample preparation device was designed for molding compound adhesion test. A series of experiments has been done with this device. The results showed that the data obtained with this device was stable. The data fluctuation was relatively small. The sample preparation device was effective in molding compound adhesion test.
Keywords
delamination; plastic packaging; specimen preparation; data fluctuation; delaminated interfaces; moisture ingression; molding compound adhesion test; plastic packages; sample preparation device; Adhesives; Compounds; Copper; Curing; Electromagnetic compatibility; Oxidation; Substrates;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronic Packaging Technology and High Density Packaging (ICEPT-HDP), 2011 12th International Conference on
Conference_Location
Shanghai
Print_ISBN
978-1-4577-1770-3
Electronic_ISBN
978-1-4577-1768-0
Type
conf
DOI
10.1109/ICEPT.2011.6066996
Filename
6066996
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