• DocumentCode
    2188065
  • Title

    Sample preparation device for molding compound adhesion test

  • Author

    Lu, Qin ; Zhang, Wenjing ; Li, Ming ; Mao, Dali

  • Author_Institution
    Sch. of Mater. Sci. & Eng., Shanghai Jiao Tong Univ., Shanghai, China
  • fYear
    2011
  • fDate
    8-11 Aug. 2011
  • Firstpage
    1
  • Lastpage
    3
  • Abstract
    Moisture ingression in plastic packages generally occurs through delaminated interfaces between different materials. So the adhesion strength between molding compound and substrate is crucial to the plastic package reliability. In the present work, a sample preparation device was designed for molding compound adhesion test. A series of experiments has been done with this device. The results showed that the data obtained with this device was stable. The data fluctuation was relatively small. The sample preparation device was effective in molding compound adhesion test.
  • Keywords
    delamination; plastic packaging; specimen preparation; data fluctuation; delaminated interfaces; moisture ingression; molding compound adhesion test; plastic packages; sample preparation device; Adhesives; Compounds; Copper; Curing; Electromagnetic compatibility; Oxidation; Substrates;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Packaging Technology and High Density Packaging (ICEPT-HDP), 2011 12th International Conference on
  • Conference_Location
    Shanghai
  • Print_ISBN
    978-1-4577-1770-3
  • Electronic_ISBN
    978-1-4577-1768-0
  • Type

    conf

  • DOI
    10.1109/ICEPT.2011.6066996
  • Filename
    6066996