DocumentCode :
2188065
Title :
Sample preparation device for molding compound adhesion test
Author :
Lu, Qin ; Zhang, Wenjing ; Li, Ming ; Mao, Dali
Author_Institution :
Sch. of Mater. Sci. & Eng., Shanghai Jiao Tong Univ., Shanghai, China
fYear :
2011
fDate :
8-11 Aug. 2011
Firstpage :
1
Lastpage :
3
Abstract :
Moisture ingression in plastic packages generally occurs through delaminated interfaces between different materials. So the adhesion strength between molding compound and substrate is crucial to the plastic package reliability. In the present work, a sample preparation device was designed for molding compound adhesion test. A series of experiments has been done with this device. The results showed that the data obtained with this device was stable. The data fluctuation was relatively small. The sample preparation device was effective in molding compound adhesion test.
Keywords :
delamination; plastic packaging; specimen preparation; data fluctuation; delaminated interfaces; moisture ingression; molding compound adhesion test; plastic packages; sample preparation device; Adhesives; Compounds; Copper; Curing; Electromagnetic compatibility; Oxidation; Substrates;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Packaging Technology and High Density Packaging (ICEPT-HDP), 2011 12th International Conference on
Conference_Location :
Shanghai
Print_ISBN :
978-1-4577-1770-3
Electronic_ISBN :
978-1-4577-1768-0
Type :
conf
DOI :
10.1109/ICEPT.2011.6066996
Filename :
6066996
Link To Document :
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