DocumentCode :
2188076
Title :
AlGaN/GaN HEMTs grown by MBE on semi-insulating HVPE GaN templates
Author :
Weimann, N.G. ; Manfra, M.J. ; Hsu, J.W.P. ; Pfeiffer, L.N. ; West, K.W. ; Lang, D.V. ; Molnar, R.J.
Author_Institution :
Lucent Technol. Bell Labs., Murray Hill, NJ, USA
fYear :
2002
fDate :
24-26 June 2002
Firstpage :
33
Abstract :
Summary form only given. Attempts to circumvent the low thermal conductivity of sapphire substrates by including in a device structure a thick (15 /spl mu/m) GaN buffer grown by HVPE between the sapphire substrate and the MBE device layer stack. The heat generated in the device close to the surface of the structure is spread laterally in the HVPE buffer, increasing the effective thermal area of the device, and lowering the thermal impedance of the HEMT device. In contrast to SiC, the sapphire substrate technology is mature and affordable. Principally, both MBE and HVPE growth may be scaled up in area to grow on readily available large diameter sapphire substrates.
Keywords :
III-V semiconductors; aluminium compounds; gallium compounds; high electron mobility transistors; molecular beam epitaxial growth; semiconductor epitaxial layers; semiconductor growth; thermal conductivity; wide band gap semiconductors; 15 micron; AlGaN-GaN; AlGaN/GaN; HEMTs; MBE; MBE device layer stack; area; effective thermal area; large diameter sapphire substrates; semi-insulating HVPE GaN templates; thermal conductivity; thermal impedance; Aluminum gallium nitride; Gallium nitride; HEMTs; MODFETs;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Device Research Conference, 2002. 60th DRC. Conference Digest
Conference_Location :
Santa Barbara, CA, USA
Print_ISBN :
0-7803-7317-0
Type :
conf
DOI :
10.1109/DRC.2002.1029493
Filename :
1029493
Link To Document :
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