• DocumentCode
    2188076
  • Title

    AlGaN/GaN HEMTs grown by MBE on semi-insulating HVPE GaN templates

  • Author

    Weimann, N.G. ; Manfra, M.J. ; Hsu, J.W.P. ; Pfeiffer, L.N. ; West, K.W. ; Lang, D.V. ; Molnar, R.J.

  • Author_Institution
    Lucent Technol. Bell Labs., Murray Hill, NJ, USA
  • fYear
    2002
  • fDate
    24-26 June 2002
  • Firstpage
    33
  • Abstract
    Summary form only given. Attempts to circumvent the low thermal conductivity of sapphire substrates by including in a device structure a thick (15 /spl mu/m) GaN buffer grown by HVPE between the sapphire substrate and the MBE device layer stack. The heat generated in the device close to the surface of the structure is spread laterally in the HVPE buffer, increasing the effective thermal area of the device, and lowering the thermal impedance of the HEMT device. In contrast to SiC, the sapphire substrate technology is mature and affordable. Principally, both MBE and HVPE growth may be scaled up in area to grow on readily available large diameter sapphire substrates.
  • Keywords
    III-V semiconductors; aluminium compounds; gallium compounds; high electron mobility transistors; molecular beam epitaxial growth; semiconductor epitaxial layers; semiconductor growth; thermal conductivity; wide band gap semiconductors; 15 micron; AlGaN-GaN; AlGaN/GaN; HEMTs; MBE; MBE device layer stack; area; effective thermal area; large diameter sapphire substrates; semi-insulating HVPE GaN templates; thermal conductivity; thermal impedance; Aluminum gallium nitride; Gallium nitride; HEMTs; MODFETs;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Device Research Conference, 2002. 60th DRC. Conference Digest
  • Conference_Location
    Santa Barbara, CA, USA
  • Print_ISBN
    0-7803-7317-0
  • Type

    conf

  • DOI
    10.1109/DRC.2002.1029493
  • Filename
    1029493