DocumentCode
2188078
Title
The performance and reliability of NIST 10-V Josephson arrays
Author
Hamilton, C.A. ; Burroughs, C.J.
Author_Institution
Nat. Inst. of Stand. & Technol., Boulder, CO, USA
fYear
1994
fDate
June 27 1994-July 1 1994
Firstpage
99
Lastpage
100
Abstract
This paper reviews eight years of fabrication of 10-V Josephson array chips at NIST and the performance and reliability of these chips at 22 different standards laboratories. Failure mechanisms and statistical data on failure rates are presented for devices made with both Nb/Nb/sub 2/O/sub 5//Pb and Nb/Al/sub 2/O/sub 3//Nb junctions.<>
Keywords
aluminium compounds; failure analysis; lead; measurement standards; niobium; niobium compounds; statistical analysis; superconducting junction devices; voltage measurement; 0-V Josephson arrays; 10 V; NIST; Nb-Al/sub 2/O/sub 3/-Nb; Nb-Nb/sub 2/O/sub 5/-Pb; Nb/Al/sub 2/O/sub 3//Nb junctions; Nb/Nb/sub 2/O/sub 5//Pb junctions; fabrication; failure mechanisms; performance; reliability; standards laboratories; statistical data; voltage standard; Critical current; Degradation; Fabrication; Failure analysis; Humidity; Laboratories; Moisture; NIST; Niobium; Stability;
fLanguage
English
Publisher
ieee
Conference_Titel
Precision Electromagnetic Measurements, 1994. Digest., 1994 Conference on
Conference_Location
Boulder, CO, USA
Print_ISBN
0-7803-1984-2
Type
conf
DOI
10.1109/CPEM.1994.333434
Filename
333434
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