Title :
Running and testing of Josephson voltage standard series arrays
Author :
Gutmann, P. ; Funck, T. ; Grimm, L.
Author_Institution :
Physikalisch Tech. Bundesanstalt, Braunschweig, Germany
fDate :
June 27 1994-July 1 1994
Abstract :
It was found that the yield of the Josephson tunnel junction series arrays produced is limited by the test systems at present commonly in use to test and work them as voltage standards. We present a new voltage biasing system. It allows a junction-by-junction inspection of the array under test between zero and 10 volts with an excellent current resolution of 10/sup -7/ A and an excellent voltage resolution of 10/sup -6/ V.<>
Keywords :
electron device testing; inspection; measurement standards; superconducting junction devices; voltage measurement; 0 to 10 V; Josephson tunnel junction series arrays; Josephson voltage standard; current resolution; junction-by-junction inspection; testing; voltage resolution; voltage standards; Circuit testing; Current measurement; Electronic equipment testing; Inspection; Microwave circuits; Production facilities; Resistors; Semiconductor device testing; System testing; Voltage;
Conference_Titel :
Precision Electromagnetic Measurements, 1994. Digest., 1994 Conference on
Conference_Location :
Boulder, CO, USA
Print_ISBN :
0-7803-1984-2
DOI :
10.1109/CPEM.1994.333437
