DocumentCode :
2188276
Title :
The effect of thermal aging on the mechanical properties of molding compounds and the reliability of electronic packages
Author :
Yang, Daoguo ; Cui, Zaifu
Author_Institution :
Guangxi Key Lab. of Manuf. Syst. & Adv. Manuf. Technol. Sch. of Mech. & Electr. Eng., Guilin Univ. of Electron. Technol., Guilin, China
fYear :
2011
fDate :
8-11 Aug. 2011
Firstpage :
1
Lastpage :
4
Abstract :
Epoxy Molding Compounds are widely used in electronic packaging as encapsulants of electronic devices. Previous research has indicated that thermal aging has great influence on the material properties of molding compounds. The thermal aging effects will certainly influence the reliability performance of the packages. It is very necessary to study the effect of thermal aging on the mechanical properties of molding compounds and the reliability of electronic packages. In this paper the effect of thermal aging on the mechanical properties of molding compounds and the reliability of electronic packages is presented. Experimental study of the aging effect on the mechanical properties of the molding compounds was performed. The samples were aged at various levels of temperature and aging times. DMA and TMA were used to measure the moduli, coefficients of thermal expansion (CTE), and the glass transition temperature (Tg). It is found that thermal aging has significant influence on the rubbery modulus and the glass transition temperature (Tg). Oxidation is believed to be one of the main mechanisms for the degradation of the material properties. A numerical model was used to estimate the modulus of the oxidized layer. 3D finite element models were established to simulate the impact of the aging effect on the stress/strain of the package. The modeling results indicate that the aging of the compounds have a significant impact on the stress/strain status in the package.
Keywords :
ageing; composite materials; electronics packaging; finite element analysis; glass transition; moulding; oxidation; resins; silicon compounds; stress-strain relations; thermal expansion; 3D finite element models; SiO2; aging effect; electronic packages; epoxy molding compounds; glass transition temperature; mechanical property; oxidation; oxidized layer; reliability; rubbery modulus; stress-strain curve; thermal aging; thermal expansion; Aging; Compounds; Electromagnetic compatibility; Electronic packaging thermal management; Mechanical factors; Reliability; Temperature;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Packaging Technology and High Density Packaging (ICEPT-HDP), 2011 12th International Conference on
Conference_Location :
Shanghai
Print_ISBN :
978-1-4577-1770-3
Electronic_ISBN :
978-1-4577-1768-0
Type :
conf
DOI :
10.1109/ICEPT.2011.6067004
Filename :
6067004
Link To Document :
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