• DocumentCode
    2188285
  • Title

    Low-voltage memories for power-aware systems

  • Author

    Itoh, Kenji

  • Author_Institution
    Central Res. Lab., Hitachi Ltd., Tokyo, Japan
  • fYear
    2002
  • fDate
    2002
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    This paper describes low-voltage RAM designs for stand-alone and embedded memories in terms of signal-to-noise-ratio designs of RAM cells and subthreshold-current reduction. First, structures and areas of current DRAM and SRAM cells are discussed. Next, low-voltage peripheral circuits that have been proposed so far are reviewed with focus on subthreshold-current reduction, speed variation, on-chip voltage conversion, and testing. Finally, based on the above discussion, a perspective is given with emphasis on needs for high-speed simple non-volatile RAMs, new devices/circuits for reducing active-mode leakage currents, and memory-rich SoC architectures.
  • Keywords
    DRAM chips; SRAM chips; high-speed integrated circuits; integrated circuit design; integrated circuit testing; leakage currents; low-power electronics; system-on-chip; DRAM cells; RAM cells; SRAM cells; active-mode leakage currents; embedded memories; high-speed nonvolatile RAM; low-voltage RAM designs; low-voltage memories; low-voltage peripheral circuits; memory-rich SoC architectures; on-chip voltage conversion; power-aware systems; signal-to-noise-ratio designs; speed variation; stand-alone memories; subthreshold-current reduction; testing; Circuit testing; Leakage current; Memory architecture; Nonvolatile memory; Random access memory; Read-write memory; Signal design; Subthreshold current; System-on-a-chip; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Low Power Electronics and Design, 2002. ISLPED '02. Proceedings of the 2002 International Symposium on
  • Print_ISBN
    1-5811-3475-4
  • Type

    conf

  • DOI
    10.1109/LPE.2002.146699
  • Filename
    1029500