DocumentCode :
2188285
Title :
Low-voltage memories for power-aware systems
Author :
Itoh, Kenji
Author_Institution :
Central Res. Lab., Hitachi Ltd., Tokyo, Japan
fYear :
2002
fDate :
2002
Firstpage :
1
Lastpage :
6
Abstract :
This paper describes low-voltage RAM designs for stand-alone and embedded memories in terms of signal-to-noise-ratio designs of RAM cells and subthreshold-current reduction. First, structures and areas of current DRAM and SRAM cells are discussed. Next, low-voltage peripheral circuits that have been proposed so far are reviewed with focus on subthreshold-current reduction, speed variation, on-chip voltage conversion, and testing. Finally, based on the above discussion, a perspective is given with emphasis on needs for high-speed simple non-volatile RAMs, new devices/circuits for reducing active-mode leakage currents, and memory-rich SoC architectures.
Keywords :
DRAM chips; SRAM chips; high-speed integrated circuits; integrated circuit design; integrated circuit testing; leakage currents; low-power electronics; system-on-chip; DRAM cells; RAM cells; SRAM cells; active-mode leakage currents; embedded memories; high-speed nonvolatile RAM; low-voltage RAM designs; low-voltage memories; low-voltage peripheral circuits; memory-rich SoC architectures; on-chip voltage conversion; power-aware systems; signal-to-noise-ratio designs; speed variation; stand-alone memories; subthreshold-current reduction; testing; Circuit testing; Leakage current; Memory architecture; Nonvolatile memory; Random access memory; Read-write memory; Signal design; Subthreshold current; System-on-a-chip; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Low Power Electronics and Design, 2002. ISLPED '02. Proceedings of the 2002 International Symposium on
Print_ISBN :
1-5811-3475-4
Type :
conf
DOI :
10.1109/LPE.2002.146699
Filename :
1029500
Link To Document :
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