• DocumentCode
    2188398
  • Title

    The effect research of PCB microvia design on thermal fatigue life of WLCSP solder joints

  • Author

    Jiazheng, Hu ; Zhaohua, Wu

  • Author_Institution
    Sch. of Mech. & Electr. Eng., Guilin Univ. of Electron. Technol., Guilin, China
  • fYear
    2011
  • fDate
    8-11 Aug. 2011
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    With the development of integrated circuit to miniaturization, the diameter of the solder joints becomes smaller and smaller and the microvias in the high density PCB also become more and more. The design of the microvia has impacted on the fatigue life of the solder joints. This paper establishes the 3D Finite Element Method symmetric models of WLCSP through studying the influence of the parameters such as diameter, depth and quantity of the microvias on thermal fatigue life of WLCSP solder joints with FEM. 0.4mm is chosen for the diamiters in the models, the Microvias are designed based on Huawei PCB design standard and 5 is chosen for the proportion of thickness and aperture. Paper describes the 3.5Sn95Pb visoplastic material properties using ANSYS built-in ANAND constitutive model and analysis the deformation and stress distribution and strain behavior of the solder joint in different microvia designs throughing the FEM. The results show that: the PCB with microvias has a shorter lifetime of the solder joints than those without miropores. If the depth of the microvias gets deeper and the proportion of thickness and aperture greater, the solder joints thermal fatigue life will get smaller. The existence of the microvias in the PCB is equivalent to reduce the thickness of the PCB, which makes the whole of the substrate deflection increased and the shear stress range and the plastic strain range in the position of the maximum stress bigger.
  • Keywords
    finite element analysis; integrated circuit reliability; printed circuit design; solders; thermal stress cracking; 3D FEM symmetric models; 3D finite element method symmetric models; ANSYS built-in ANAND constitutive model; Huawei PCB design standard; PCB microvia design; WLCSP solder joints; integrated circuit; plastic strain; shear stress; size 0.4 mm; substrate deflection; thermal fatigue life; Apertures; Fatigue; Materials; Mathematical model; Soldering; Strain; Stress;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Packaging Technology and High Density Packaging (ICEPT-HDP), 2011 12th International Conference on
  • Conference_Location
    Shanghai
  • Print_ISBN
    978-1-4577-1770-3
  • Electronic_ISBN
    978-1-4577-1768-0
  • Type

    conf

  • DOI
    10.1109/ICEPT.2011.6067008
  • Filename
    6067008