Title :
A study of the stability of some Zener-diode based voltage standards
Author :
Witt, T.J. ; Reymann, D. ; Avrons, D.
Author_Institution :
Bur. Int. des Poids et Mesures, Sevres, France
fDate :
June 27 1994-July 1 1994
Abstract :
We report on a study of factors limiting the precision of Zener-diode based electronic voltage standards of the type the most widely used at the highest levels of accuracy in national metrology institutes. Frequency-dependent noise is the major factor limiting short-term stability to about one part in 10/sup 8/. Medium- and long-term stability is severely limited by humidity effects; variations of relative humidity of 0.01 can cause changes of 0.1 /spl mu/V or more in the 1.018 V output.<>
Keywords :
Zener diodes; measurement standards; semiconductor device noise; stability; voltage measurement; 1.018 V; Zener-diode; frequency-dependent noise; humidity effects; long-term stability; medium-term stability; relative humidity; short-term stability; stability; voltage standards; Circuit noise; Frequency; Humidity; Laboratories; Metrology; Optical noise; Resistors; Stability; Temperature; Voltage;
Conference_Titel :
Precision Electromagnetic Measurements, 1994. Digest., 1994 Conference on
Conference_Location :
Boulder, CO, USA
Print_ISBN :
0-7803-1984-2
DOI :
10.1109/CPEM.1994.333451
