DocumentCode
2188626
Title
Low-leakage asymmetric-cell SRAM
Author
Azizi, Navid ; Moshovos, Andreas ; Najm, Farid N.
Author_Institution
Dept. of Electr. & Comput. Eng., Toronto Univ., Ont., Canada
fYear
2002
fDate
2002
Firstpage
48
Lastpage
51
Abstract
Introduces a novel family of asymmetric dual-Vt SRAM cell designs that reduce leakage power in caches while maintaining low access latency. Our designs exploit the strong bias towards zero at the bit level exhibited by the memory value stream of ordinary programs. Compared to conventional symmetric high-performance cells, our cells offer significant leakage reduction in the zero state and in some cases also in the one state albeit to a lesser extent. A novel sense-amplifier, in coordination with dummy bitlines, allows for read times to be on par with conventional symmetric cells. With one cell design, leakage is reduced by 7× (in the zero state) with no performance degradation. An alternative cell design reduces leakage by 40× (in the zero state) with a performance degradation of 5%.
Keywords
CMOS memory circuits; SRAM chips; cache storage; cellular arrays; integrated circuit reliability; leakage currents; access latency; asymmetric-cell SRAM; bit level; caches; dummy bitlines; leakage power; memory value stream; performance degradation; sense-amplifier; zero state; Circuits; Degradation; Delay; Permission; Power dissipation; Process design; Random access memory; Semiconductor memory; Technological innovation; Threshold voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Low Power Electronics and Design, 2002. ISLPED '02. Proceedings of the 2002 International Symposium on
Print_ISBN
1-5811-3475-4
Type
conf
DOI
10.1109/LPE.2002.146707
Filename
1029518
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