Title :
The effect of scattering on drive current of nanotransistors
Author :
Svizhenko, A. ; Anantram, M.P.
Author_Institution :
NASA Ames Res. Center, Moffett Field, CA, USA
Abstract :
In the nanoscale regime, the electron mean free path is comparable to the transistor channel length. Therefore, the electron transport is neither ballistic nor diffusive as quantum coherence is partially destroyed by scattering on phonons, surface roughness and impurities. In this work we model electron-phonon scattering within a quantum mechanical approach using a non-equilibrium Green´s function method. Based on the calculations, we show that the resistance per unit length in the source side is much larger than in the drain side. Thus, in order to achieve large drive current in nanotransistors, it is important to keep the source extension region short. We model a nanoscale double gate MOSFET as it is an important candidate for a scaled-down transistor.
Keywords :
Green´s function methods; MOSFET; electron mean free path; electron-phonon interactions; impurity scattering; nanoelectronics; quantum theory; scattering; semiconductor device models; surface scattering; ballistic/diffusive electron transport; electron mean free path; electron-phonon scattering; large nanotransistor drive current; nanoscale double gate MOSFET; nanotransistor drive current scattering effects; nonequilibrium Green´s function method; phonons/surface roughness/impurity scattering; quantum coherence; quantum mechanics; source extension region length; source/drain side resistance per unit length; transistor channel length; transistor down scaling; Coherence; Electrons; Impurities; MOSFETs; Particle scattering; Phonons; Quantum mechanics; Rough surfaces; Surface resistance; Surface roughness;
Conference_Titel :
Device Research Conference, 2002. 60th DRC. Conference Digest
Conference_Location :
Santa Barbara, CA, USA
Print_ISBN :
0-7803-7317-0
DOI :
10.1109/DRC.2002.1029529