• DocumentCode
    2189
  • Title

    A Low-Noise High-Frame-Rate 1-D Decoding Readout Architecture for Stacked Image Sensors

  • Author

    Xhakoni, Adi ; Ha Le-Thai ; Gielen, Georges G. E.

  • Author_Institution
    Dept. of Electr. Eng., Katholieke Univ. Leuven, Leuven, Belgium
  • Volume
    14
  • Issue
    6
  • fYear
    2014
  • fDate
    Jun-14
  • Firstpage
    1966
  • Lastpage
    1973
  • Abstract
    The continuously increasing array resolution of CMOS imagers poses a great challenge in combining high-frame-rate and low light detection in the same sensor. To cope with this, parallel readout architectures are needed. This paper proposes a readout architecture for 8K stacked image sensors, which uses a novel 1D decoding readout based on block-of-pixels and incremental-sigma-delta ADCs. The proposed 1D decoding system reduces the control lines of the pixels and allows a simpler decoding, an increased parallelism, and an improved robustness over process yield. The experimental results from a test chip implemented in a standard CIS technology show that at 10 μm pixel pitch, the proposed readout architecture can achieve a high-frame-rate of 730 frames/s and a low read noise of 1.4 e-. In a real stacked implementation, the frame rate can further increase to about 960 frames/s at 8K resolution, at the cost of a slight increase in thermal noise by 14 μV.
  • Keywords
    CMOS image sensors; readout electronics; sensor arrays; sigma-delta modulation; thermal noise; CMOS imager array resolution; incremental sigma-delta ADC; low noise high frame rate 1D decoding readout architecture; parallel readout architecture; pixel block; size 10 mum; stacked image sensor; standard CIS technology; thermal noise; Clocks; Decoding; Image resolution; Noise; Parallel processing; Sensors; Thermal noise; 3-D integration; ADC; Image sensor; UHDTV; dynamic range; high frame rate; high resolution; incremental $SigmaDelta$; low noise; stacked;
  • fLanguage
    English
  • Journal_Title
    Sensors Journal, IEEE
  • Publisher
    ieee
  • ISSN
    1530-437X
  • Type

    jour

  • DOI
    10.1109/JSEN.2014.2307792
  • Filename
    6747320