DocumentCode :
2189173
Title :
Interfacial reaction between the thermopile materials and eutectic Sn-based solders
Author :
Li Shen ; Xu, Guangchen ; Zhao, Ran ; Guo, Fu
Author_Institution :
Coll. of Mater. Sci. & Eng., Beijing Univ. of Technol., Beijing, China
fYear :
2011
fDate :
8-11 Aug. 2011
Firstpage :
1
Lastpage :
4
Abstract :
The indium-based solders and bismuth-based solders are commonly employed in soldering the thermopile. Since the wettability between bismuth telluride materials and low melting point alloy solders is poor, a nickel layer was employed on the surface of thermoelectric materials. In this study, in the atmospheric environment, the eutectic Sn-Bi and Sn-In solders spreaded on the p-type thermoelectric respectively without using soldering flux, the corresponding interfacial microstructures were indentified. The interfacial reaction is more sufficient under 300 °C when comparing to that under 250 °C. In addition, a thin nickel layer was deposited on the thermoelectric unit by vapor deposition facility. However, a thin Ni-plated layer on thermoelectric materials might induce severe formation of cracks.
Keywords :
bismuth alloys; cracks; crystal microstructure; indium alloys; interface structure; melting point; soldering; solders; surface chemistry; thermoelectricity; tin alloys; wetting; SnBi; SnIn; bismuth telluride materials; cracks; eutectic tin-based solders; interfacial microstructures; interfacial reaction; melting point alloy solders; p-type thermoelectric unit; soldering; soldering flux; thermopile materials; vapor deposition; wettability; Bismuth; Materials; Microstructure; Nickel; Plasma temperature; Scanning electron microscopy;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Packaging Technology and High Density Packaging (ICEPT-HDP), 2011 12th International Conference on
Conference_Location :
Shanghai
Print_ISBN :
978-1-4577-1770-3
Electronic_ISBN :
978-1-4577-1768-0
Type :
conf
DOI :
10.1109/ICEPT.2011.6067035
Filename :
6067035
Link To Document :
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