• DocumentCode
    2189460
  • Title

    Structured cold point thermoelectric coolers

  • Author

    Ghoshal, U.

  • Author_Institution
    Austin Research Laboratory, IBM Res., Austin, TX, USA
  • fYear
    2002
  • fDate
    24-26 June 2002
  • Firstpage
    125
  • Lastpage
    128
  • Abstract
    Solid-state thermoelectric coolers can revolutionize thermal management of electronics and optoelectronic systems, and small-scale refrigeration if the coolers could attain thermodynamic efficiency greater than 30% of the ideal Carnot cycle. The maximum temperature differential and the efficiency of thermoelectric coolers are known to depend on material properties through the thermoelectric figure-of-merit ZT=S/sup 2//spl sigma/T//spl lambda/. Z has units of inverse temperature, and depends on the Seebeck coefficient S, the electrical conductivity /spl sigma/, the thermal conductivity /spl lambda/, and the temperature T. The efficiency requirements imply that the figure-of-merit needs to be increased from ZT/spl sim/1 typical of bismuth chalcogenides at room temperatures to ZT>3. The cooling power per unit area is only dependent on the critical transport length of the thermoelement and can easily exceed 50 W/cm/sup 2/ in thin-film cooler structures (U. Ghoshal and R. Schmidt, ISSCC Dig. Tech. Papers, vol. 43, p. 216, 2000). We have been investigating the scaling properties of thin-film thermoelectric coolers, and the properties of structured point contacts at the cold end (Y.S. Ju and U. Ghoshal, J. Appl. Phys., vol. 88, p. 4135, 2000).
  • Keywords
    Seebeck effect; cooling; point contacts; thermal conductivity; thermal management (packaging); thermoelectric devices; Carnot cycle; Seebeck coefficient; bismuth chalcogenides; cold end structured point contacts; cooling power per unit area; electrical conductivity; electronics thermal management; material properties; maximum temperature differential; optoelectronic systems thermal management; scaling properties; solid-state thermoelectric coolers; structured cold point thermoelectric coolers; thermal conductivity; thermodynamic efficiency; thermoelectric cooler efficiency; thermoelectric figure-of-merit; thermoelement critical transport length; thin-film cooler structures; thin-film thermoelectric coolers; Material properties; Refrigeration; Solid state circuits; Temperature dependence; Thermal conductivity; Thermal management; Thermal management of electronics; Thermodynamics; Thermoelectricity; Transistors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Device Research Conference, 2002. 60th DRC. Conference Digest
  • Conference_Location
    Santa Barbara, CA, USA
  • Print_ISBN
    0-7803-7317-0
  • Type

    conf

  • DOI
    10.1109/DRC.2002.1029548
  • Filename
    1029548