Title :
Packaging of printed-circuit lines and its danger for narrow pulse distortion
Author :
Shigesawa, H. ; Tsuji, M.
Author_Institution :
Dept. of Electron., Doshisha Univ., Kyoto, Japan
Abstract :
We report here a new behavioral feature of a narrow pulse transmitted on a coplanar waveguide (CPW), putting the special stress on the effects caused by the packaging of such a waveguide. An explanation based on the power-leakage effect leads to a clear physical understanding of why such features necessarily appear.<>
Keywords :
electric distortion; microstrip lines; packaging; CPW; coplanar waveguide; narrow pulse distortion; packaging; power-leakage effect; printed-circuit lines; Coplanar waveguides; Packaging; Stress;
Conference_Titel :
Microwave Symposium Digest, 1994., IEEE MTT-S International
Conference_Location :
San Diego, CA, USA
Print_ISBN :
0-7803-1778-5
DOI :
10.1109/MWSYM.1994.335124
