Title :
Efficiency degradation due to carrier build-up in the broadened waveguides of high-power laser diodes: analytical theory and numerical validation
Author :
Avrutin, Eugene A. ; Ryvkin, Boris S.
Author_Institution :
Dept. of Electron., York Univ., UK
Abstract :
An analytical theory is developed for the optical loss, output and external efficiency degradation due to the buildup of free carriers in the optical confinement layer of large-cavity laser diodes operated high above threshold. On the basis of this theory, it is shown that asymmetric, non-broadened waveguides can be a viable, and possibly superior, alternative to symmetric broadened ones in high power laser diodes from the optical losses, output efficiency, and internal quantum efficiency points of view. The foundations of the theory are validated by numerical simulations using the commercial package Las tip™.
Keywords :
laser cavity resonators; numerical analysis; optical losses; optical waveguides; semiconductor lasers; Las tip; analytical theory; broadened waveguides; external efficiency degradation; free carrier building; high-power laser diode; internal quantum efficiency; large-cavity laser diodes; numerical simulation; optical confinement layer; optical loss; Carrier confinement; Degradation; Diode lasers; Numerical simulation; Optical losses; Optical waveguide theory; Optical waveguides; Packaging; Quantum mechanics; Waveguide theory;
Conference_Titel :
Numerical Simulation of Optoelectronic Devices, 2005. NUSOD '05. Proceedings of the 5th International Conference on
Print_ISBN :
0-7803-9149-7
DOI :
10.1109/NUSOD.2005.1518145