• DocumentCode
    2190005
  • Title

    A resonant tunneling permeable base transistor with Al-free tunneling barriers

  • Author

    Lind, E. ; Lindstrom, P. ; Pietzonka, I. ; Seifert, W. ; Wernersson, L.-E.

  • Author_Institution
    Dept. of Solid State Phys., Lund Univ., Sweden
  • fYear
    2002
  • fDate
    24-26 June 2002
  • Firstpage
    155
  • Lastpage
    156
  • Abstract
    Resonant tunneling based devices are an intriguing set of devices with promising high speed, low power and high functionality capabilities. We have developed an technology to embed metallic features on the nm-scale inside a semiconductor. By combining such metallic features and heterostructures we have developed a new type of tunneling transistor, the so called Resonant Tunneling Permeable Base Transistor (RT-PBT), where a double barrier heterostructure is placed in close vicinity to a metal grating. A three step fabrication process is described.
  • Keywords
    III-V semiconductors; gallium arsenide; gallium compounds; microwave bipolar transistors; permeable base transistors; resonant tunnelling transistors; semiconductor heterojunctions; 20 to 100 GHz; Al-free tunneling barriers; GaAsP-GaAs-GaAsP; GaAsP/GaAs/GaAsP heterostructure; MOVPE; RT-PBT; W; W features; double barrier heterostructure; electron beam lithography; lift-off; metal grating; resonant tunneling PBT; resonant tunneling permeable base transistor; three step fabrication process; Electron devices; Epitaxial growth; Epitaxial layers; Frequency estimation; Gratings; Nanoscale devices; Physics; Resonant tunneling devices; Semiconductor diodes; Solid state circuits;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Device Research Conference, 2002. 60th DRC. Conference Digest
  • Conference_Location
    Santa Barbara, CA, USA
  • Print_ISBN
    0-7803-7317-0
  • Type

    conf

  • DOI
    10.1109/DRC.2002.1029571
  • Filename
    1029571