Title :
An applied framework for automatic inference of affective states from speech
Author :
Shikler, Tal Sobol
Author_Institution :
Dept. of Ind. Eng. & Manage., Ben-Gurion Univ. of the Negev, Beer-Sheva, Israel
Abstract :
Affective states and their behavioral expressions are an important aspect of human reasoning and communication. Their automated recognition can be integrated into a wide variety of applications. Therefore, it is of interest to design systems that can infer the affective states of speakers from their non-verbal expressions in speech. This paper presents a framework of such a system, its design and validation. The framework comprises the definition and extraction of vocal features useful for classification. For each utterance, the designed system infers the level of nine affective-state groups, such as thinking, excited, and interested (multiple-label classification) with overall accuracy of 83%. The validation and generalization of the system comprised characterization of a 570 affective state concepts as combinations of the affective-state groups, and multimodal analysis of affective states that were naturally evoked during sustained human-computer interactions, generalizing to new speakers and to a different language with no additional training.
Keywords :
human computer interaction; speech recognition; affective states; automated recognition; automatic inference; behavioral expressions; human reasoning; human-computer interactions; multiple-label classification; Engineering management; Feature extraction; Humans; Industrial engineering; Natural languages; Signal analysis; Speech analysis; Speech processing; Speech recognition; Speech synthesis; Speech processing; affective computing; bi-lingual analysis; human-conputer interaction; multi-modal analysis; multilabel classification; prosody;
Conference_Titel :
Electrical and Electronics Engineers in Israel, 2008. IEEEI 2008. IEEE 25th Convention of
Conference_Location :
Eilat
Print_ISBN :
978-1-4244-2481-8
Electronic_ISBN :
978-1-4244-2482-5
DOI :
10.1109/EEEI.2008.4736590