• DocumentCode
    2190717
  • Title

    Determining shape and reflectance properties objects by using diffuse illumination

  • Author

    Kim, Tae-Eun ; Ryu, S.H. ; Choi, J.S.

  • Author_Institution
    Dept. of Electron. Eng., Chung-Ang Univ., Seoul, South Korea
  • fYear
    1996
  • fDate
    18-21 Nov 1996
  • Firstpage
    520
  • Lastpage
    523
  • Abstract
    We propose a technique to estimate reflectance properties and the recovery of shape by using the Sample sphere and Diffuse Illumination Method. The Photometric Stereo Method (PSM) is generally based on a direct light source. Our PSM is modified with diffuse illumination and then applied to a hybrid reflectance model which consists of two main components, Lambertian and specular reflectance. A sample sphere made of one material is used to estimate the reflectance properties by using the LMS algorithm. We make a reference table which consists of surface normal and brightness values using estimated reflectance parameters. The photometric matching method proposed is robust because it matches object images with the reference table considering the neighbor brightness distribution. The 3-D shape of an object can be recovered from pixel intensity distribution and a reference table. The algorithm should be applicable to vision inspection systems
  • Keywords
    brightness; image matching; image reconstruction; image sampling; least mean squares methods; photometry; reflectometry; shape measurement; stereo image processing; 3-D shape; LMS algorithm; Lambertian reflectance; diffuse illumination; hybrid reflectance model; neighbor brightness distribution; object image matching; object reflectance properties; object shape determination; photometric stereo method; pixel intensity distribution; reference table; sample sphere method; shape recovery; specular reflectance; surface normal; vision inspection systems; Brightness; Least squares approximation; Light sources; Lighting; Machine vision; Parameter estimation; Photometry; Reflectivity; Robustness; Shape;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Circuits and Systems, 1996., IEEE Asia Pacific Conference on
  • Conference_Location
    Seoul
  • Print_ISBN
    0-7803-3702-6
  • Type

    conf

  • DOI
    10.1109/APCAS.1996.569328
  • Filename
    569328