• DocumentCode
    2190825
  • Title

    Runtime mechanisms for leakage current reduction in CMOS VLSI circuits

  • Author

    Abdollahi, Afshin ; Fallah, Farzan ; Massoud

  • Author_Institution
    University of Southern California
  • fYear
    2002
  • fDate
    14-14 Aug. 2002
  • Firstpage
    213
  • Lastpage
    218
  • Keywords
    Algorithm design and analysis; Circuits; Dynamic voltage scaling; Laboratories; Leakage current; Permission; Power dissipation; Runtime; Threshold voltage; Very large scale integration;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Low Power Electronics and Design, 2002. ISLPED '02. Proceedings of the 2002 International Symposium on
  • Conference_Location
    Monterey, CA, USA
  • Print_ISBN
    1-5811-3475-4
  • Type

    conf

  • DOI
    10.1109/LPE.2002.146739
  • Filename
    1029605
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2190825