Title :
Runtime mechanisms for leakage current reduction in CMOS VLSI circuits
Author :
Abdollahi, Afshin ; Fallah, Farzan ; Massoud
Author_Institution :
University of Southern California
Keywords :
Algorithm design and analysis; Circuits; Dynamic voltage scaling; Laboratories; Leakage current; Permission; Power dissipation; Runtime; Threshold voltage; Very large scale integration;
Conference_Titel :
Low Power Electronics and Design, 2002. ISLPED '02. Proceedings of the 2002 International Symposium on
Conference_Location :
Monterey, CA, USA
Print_ISBN :
1-5811-3475-4
DOI :
10.1109/LPE.2002.146739
