DocumentCode
2190845
Title
Investigation of cathode spots and plasma formation of vacuum arcs by high speed microscopy and spectroscopy
Author
Siemroth, Peter ; Schülke, Thomas ; Witke, Thomas ; Rackwitz, Niels
Author_Institution
Fraunhofer-Inst. for Mater. Phys. & Surface Eng., Dresden, Germany
Volume
1
fYear
1996
fDate
21-26 Jul 1996
Firstpage
226
Abstract
Though the vacuum arc cathode spot has been under investigation for more than a century, its structure and operation is still discussed controversially. Experimentally measured parameters and descriptions of the visible structures given by different authors far from provide a uniform picture. In the present paper, the wide range of findings, parameter values and phenomenological descriptions are explained as different semblances of a complex structured object. The random behavior of all arc spot related parameters, mostly stated as a factor complicating their accessibility, gives the key to a better understanding of its nature. It is shown that the arc spot is mainly characterized by the statistical self-similarity of its structure. Recognizing fractal structures as one of the main features of the arc spot, its comparable appearance on different spatial scales is understandable. Scale dependent values of structure dimensions and time constants are inevitable consequences of this “fractal picture”
Keywords
cathodes; electric breakdown; fractals; insulation testing; microscopy; plasma diagnostics; plasma production; spectroscopy; vacuum arcs; vacuum breakdown; vacuum insulation; complex structured object; fractal structures; high speed microscopy; high speed spectroscopy; plasma formation; statistical self-similarity; vacuum arc cathode spots; Cathodes; Fractals; Optical microscopy; Optical scattering; Physics; Plasma materials processing; Spatial resolution; Spectroscopy; Time measurement; Vacuum arcs;
fLanguage
English
Publisher
ieee
Conference_Titel
Discharges and Electrical Insulation in Vacuum, 1996. Proceedings. ISDEIV., XVIIth International Symposium on
Conference_Location
Berkeley, CA
Print_ISBN
0-7803-2906-6
Type
conf
DOI
10.1109/DEIV.1996.545355
Filename
545355
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