Title :
A procedure for accurate noise measurements of one port devices with high reflection coefficients
Author :
Miranda, J.M. ; Sebastian, J.L. ; Krozer, V. ; Grub, A.
Author_Institution :
Dept. Fisica Aplicada III, Complutense Univ., Madrid, Spain
Abstract :
This work presents a procedure to reduce effectively the uncertainty of noise measurements of highly reflective one-port DUT´s. This procedure consists of inserting an attenuator between the calibration reference plane and the DUT. The measurement RSS uncertainty has been calculated analytically and an excellent improvement of the accuracy and repeatability has been obtained when attenuations of moderate values were used.<>
Keywords :
attenuators; calibration; electric noise measurement; measurement errors; microwave measurement; semiconductor device noise; accuracy; attenuator; calibration reference plane; measurement RSS uncertainty; noise measurements; one port devices; reflection coefficients; repeatability; Attenuation measurement; Attenuators; Calibration; Measurement uncertainty; Noise measurement;
Conference_Titel :
Microwave Symposium Digest, 1994., IEEE MTT-S International
Conference_Location :
San Diego, CA, USA
Print_ISBN :
0-7803-1778-5
DOI :
10.1109/MWSYM.1994.335171
