DocumentCode
2190870
Title
A procedure for accurate noise measurements of one port devices with high reflection coefficients
Author
Miranda, J.M. ; Sebastian, J.L. ; Krozer, V. ; Grub, A.
Author_Institution
Dept. Fisica Aplicada III, Complutense Univ., Madrid, Spain
fYear
1994
fDate
23-27 May 1994
Firstpage
1065
Abstract
This work presents a procedure to reduce effectively the uncertainty of noise measurements of highly reflective one-port DUT´s. This procedure consists of inserting an attenuator between the calibration reference plane and the DUT. The measurement RSS uncertainty has been calculated analytically and an excellent improvement of the accuracy and repeatability has been obtained when attenuations of moderate values were used.<>
Keywords
attenuators; calibration; electric noise measurement; measurement errors; microwave measurement; semiconductor device noise; accuracy; attenuator; calibration reference plane; measurement RSS uncertainty; noise measurements; one port devices; reflection coefficients; repeatability; Attenuation measurement; Attenuators; Calibration; Measurement uncertainty; Noise measurement;
fLanguage
English
Publisher
ieee
Conference_Titel
Microwave Symposium Digest, 1994., IEEE MTT-S International
Conference_Location
San Diego, CA, USA
ISSN
0149-645X
Print_ISBN
0-7803-1778-5
Type
conf
DOI
10.1109/MWSYM.1994.335171
Filename
335171
Link To Document