DocumentCode :
2191052
Title :
A microarchitectural-level step-power analysis tool
Author :
El-Essawy, Wael ; Albonesi, David H. ; Sinharoy, Balaram
Author_Institution :
Dept. of Electr. & Comput. Eng., Rochester Univ., NY, USA
fYear :
2002
fDate :
2002
Firstpage :
263
Lastpage :
266
Abstract :
Clock gating is an effective means for reducing average power consumption. However, clock gating can exacerbate maximum cycle-to-cycle current swings, or the step-power (Ldi/dt) problem. We present a microarchitecture-level step-power simulator and demonstrate its use in exploring how design alternatives impact relative step-power levels. We show how the tool can be used to identify major sources of high microprocessor step-power events. Our experiments indicate that branch mispredictions are a major cause of high step-power occurrences. We also show that high step-power events are infrequent which suggest that architectural techniques may limit step-power at potentially low performance cost.
Keywords :
circuit CAD; circuit simulation; clocks; inductance; integrated circuit design; integrated circuit modelling; integrated circuit noise; integrated circuit reliability; logic CAD; logic simulation; low-power electronics; microprocessor chips; architectural simulation; architectural techniques; average power consumption reduction; branch mispredictions; clock gating; inductive noise reliability problems; maximum cycle-to-cycle current swings; microarchitectural-level step-power analysis tools; microarchitecture-level step-power simulator; microprocessor high step-power events; performance costs; step-power level design alternatives impact; step-power limiting; step-power problem; Clocks; Computational modeling; Computer simulation; Costs; Energy consumption; Frequency; Microarchitecture; Microprocessors; Noise level; Power system modeling;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Low Power Electronics and Design, 2002. ISLPED '02. Proceedings of the 2002 International Symposium on
Print_ISBN :
1-5811-3475-4
Type :
conf
DOI :
10.1109/LPE.2002.146751
Filename :
1029617
Link To Document :
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