• DocumentCode
    2191052
  • Title

    A microarchitectural-level step-power analysis tool

  • Author

    El-Essawy, Wael ; Albonesi, David H. ; Sinharoy, Balaram

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Rochester Univ., NY, USA
  • fYear
    2002
  • fDate
    2002
  • Firstpage
    263
  • Lastpage
    266
  • Abstract
    Clock gating is an effective means for reducing average power consumption. However, clock gating can exacerbate maximum cycle-to-cycle current swings, or the step-power (Ldi/dt) problem. We present a microarchitecture-level step-power simulator and demonstrate its use in exploring how design alternatives impact relative step-power levels. We show how the tool can be used to identify major sources of high microprocessor step-power events. Our experiments indicate that branch mispredictions are a major cause of high step-power occurrences. We also show that high step-power events are infrequent which suggest that architectural techniques may limit step-power at potentially low performance cost.
  • Keywords
    circuit CAD; circuit simulation; clocks; inductance; integrated circuit design; integrated circuit modelling; integrated circuit noise; integrated circuit reliability; logic CAD; logic simulation; low-power electronics; microprocessor chips; architectural simulation; architectural techniques; average power consumption reduction; branch mispredictions; clock gating; inductive noise reliability problems; maximum cycle-to-cycle current swings; microarchitectural-level step-power analysis tools; microarchitecture-level step-power simulator; microprocessor high step-power events; performance costs; step-power level design alternatives impact; step-power limiting; step-power problem; Clocks; Computational modeling; Computer simulation; Costs; Energy consumption; Frequency; Microarchitecture; Microprocessors; Noise level; Power system modeling;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Low Power Electronics and Design, 2002. ISLPED '02. Proceedings of the 2002 International Symposium on
  • Print_ISBN
    1-5811-3475-4
  • Type

    conf

  • DOI
    10.1109/LPE.2002.146751
  • Filename
    1029617